BibTeX record conf/itc/MidkiffK89

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@inproceedings{DBLP:conf/itc/MidkiffK89,
  author       = {Scott F. Midkiff and
                  Wern{-}Yan Koe},
  title        = {Test Effectiveness Metrics and {CMOS} Faults},
  booktitle    = {Proceedings International Test Conference 1989, Washington, D.C.,
                  USA, August 1989},
  pages        = {653--659},
  publisher    = {{IEEE} Computer Society},
  year         = {1989},
  url          = {https://doi.org/10.1109/TEST.1989.82352},
  doi          = {10.1109/TEST.1989.82352},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MidkiffK89.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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