BibTeX record: conf/itc/McCluskey93

download as .bib file

@inproceedings{DBLP:conf/itc/McCluskey93,
  author    = {Edward J. McCluskey},
  title     = {Quality and Single-Stuck Faults.},
  booktitle = {Proceedings {IEEE} International Test Conference 1993, Designing,
               Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
               17-21, 1993},
  year      = {1993},
  pages     = {597},
  crossref  = {DBLP:conf/itc/1993},
  url       = {http://dx.doi.org/10.1109/TEST.1993.470645},
  doi       = {10.1109/TEST.1993.470645},
  timestamp = {Wed, 03 Sep 2014 05:05:08 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/itc/McCluskey93},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/itc/1993,
  title     = {Proceedings {IEEE} International Test Conference 1993, Designing,
               Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
               17-21, 1993},
  year      = {1993},
  publisher = {{IEEE} Computer Society},
  isbn      = {0-7803-1430-1},
  timestamp = {Wed, 03 Sep 2014 05:05:08 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/itc/1993},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}