BibTeX record conf/itc/McAnneyBG84

download as .bib file

@inproceedings{DBLP:conf/itc/McAnneyBG84,
  author       = {William H. McAnney and
                  Paul H. Bardell and
                  V. P. Gupta},
  title        = {Random Testing for Stuck-At Storage Cells in an Embedded Memory},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {157--166},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 13:40:15 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/McAnneyBG84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.