<?xml version="1.0"?>
<dblp>
<inproceedings key="conf/itc/MaxwellOADJQW00" mdate="2012-02-08">
<author>Peter C. Maxwell</author>
<author>Pete O'Neill</author>
<author>Robert C. Aitken</author>
<author>Ronald Dudley</author>
<author>Neal Jaarsma</author>
<author>Minh Quach</author>
<author>Don Wiseman</author>
<title>Current ratios: a self-scaling technique for production IDDQ testing.</title>
<pages>1148-1156</pages>
<year>2000</year>
<crossref>conf/itc/2000</crossref>
<booktitle>ITC</booktitle>
<url>db/conf/itc/itc2000.html#MaxwellOADJQW00</url>
<ee>http://doi.ieeecomputersociety.org/10.1109/TEST.2000.894324</ee>
</inproceedings>
</dblp>
