@inproceedings{DBLP:conf/itc/MaurouxVBDGPG09,
author = {Pierre-Didier Mauroux and
Arnaud Virazel and
Alberto Bosio and
Luigi Dilillo and
Patrick Girard and
Serge Pravossoudovitch and
Beno\^{\i}t Godard},
title = {NAND flash testing: A preliminary study on actual defects},
booktitle = {ITC},
year = {2009},
pages = {1},
ee = {http://dx.doi.org/10.1109/TEST.2009.5355898},
crossref = {DBLP:conf/itc/2009},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/itc/2009,
editor = {Gordon W. Roberts and
Bill Eklow},
title = {2009 IEEE International Test Conference, ITC 2009, Austin,
TX, USA, November 1-6, 2009},
booktitle = {ITC},
publisher = {IEEE},
year = {2009},
isbn = {978-1-4244-4868-5},
ee = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5348788},
bibsource = {DBLP, http://dblp.uni-trier.de}
}