MaugardWOK03'

@inproceedings{DBLP:conf/itc/MaugardWOK03,
  author    = {Gwenol{\'e} Maugard and
               Carsten Wegener and
               Tom O'Dwyer and
               Michael Peter Kennedy},
  title     = {Method of reducing contactor effect when testing high-precision
               ADCs},
  booktitle = {ITC},
  year      = {2003},
  pages     = {210-217},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270842},
  crossref  = {DBLP:conf/itc/2003},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/2003,
  title     = {Proceedings 2003 International Test Conference (ITC 2003),
               Breaking Test Interface Bottlenecks, 28 September - 3 October
               2003, Charlotte, NC, USA},
  publisher = {IEEE Computer Society},
  year      = {2003},
  isbn      = {0-7803-8106-8},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}