BibTeX record conf/itc/MannTSB04

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@inproceedings{DBLP:conf/itc/MannTSB04,
  author       = {William R. Mann and
                  Frederick L. Taber and
                  Philip W. Seitzer and
                  Jerry J. Broz},
  title        = {The Leading Edge of Production Wafer Probe Test Technology},
  booktitle    = {Proceedings 2004 International Test Conference {(ITC} 2004), October
                  26-28, 2004, Charlotte, NC, {USA}},
  pages        = {1168--1195},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/TEST.2004.1387391},
  doi          = {10.1109/TEST.2004.1387391},
  timestamp    = {Thu, 23 Mar 2023 23:58:37 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MannTSB04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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