MalikC84'

@inproceedings{DBLP:conf/itc/MalikC84,
  author    = {Sushil K. Malik and
               E. F. Chace},
  title     = {MOS Gate Oxide Quality Control and Reliability Assessment
               by Voltage Ramping},
  booktitle = {ITC},
  year      = {1984},
  pages     = {384-389},
  crossref  = {DBLP:conf/itc/1984},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/1984,
  title     = {Proceedings International Test Conference 1984, Philadelphia,
               PA, USA, October 1984},
  booktitle = {ITC},
  publisher = {IEEE Computer Society},
  year      = {1984},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}