BibTeX record conf/itc/MaenoNSK92

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@inproceedings{DBLP:conf/itc/MaenoNSK92,
  author       = {Hideshi Maeno and
                  Koji Nii and
                  S. Sakayanagi and
                  S. Kato},
  title        = {{LSSD} Compatible and Concurrently Testable Ram},
  booktitle    = {Proceedings {IEEE} International Test Conference 1992, Discover the
                  New World of Test and Design, Baltimore, Maryland, USA, September
                  20-24, 1992},
  pages        = {608--614},
  publisher    = {{IEEE} Computer Society},
  year         = {1992},
  url          = {https://doi.org/10.1109/TEST.1992.527881},
  doi          = {10.1109/TEST.1992.527881},
  timestamp    = {Tue, 07 May 2024 20:06:46 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/MaenoNSK92.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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