Robert Madge B. H. Goh V. Rajagopalan C. Macchietto W. Robert Daasch Chris Schuermyer C. Taylor David Turner Screening MinVDD Outliers Using Feed-Forward Voltage Testing. 673-682 2002 conf/itc/2002 ITC http://csdl.computer.org/comp/proceedings/itc/2002/7543/00/75430673abs.htm db/conf/itc/itc2002.html#MadgeGRMDSTT02