BibTeX record conf/itc/MadgeGRMDSTT02

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@inproceedings{DBLP:conf/itc/MadgeGRMDSTT02,
  author       = {Robert Madge and
                  B. H. Goh and
                  V. Rajagopalan and
                  C. Macchietto and
                  W. Robert Daasch and
                  Chris Schuermyer and
                  C. Taylor and
                  David Turner},
  title        = {Screening MinVDD Outliers Using Feed-Forward Voltage Testing},
  booktitle    = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
                  MD, USA, October 7-10, 2002},
  pages        = {673--682},
  publisher    = {{IEEE} Computer Society},
  year         = {2002},
  url          = {https://doi.org/10.1109/TEST.2002.1041819},
  doi          = {10.1109/TEST.2002.1041819},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MadgeGRMDSTT02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}