MadgeGRMDSTT02'

@inproceedings{DBLP:conf/itc/MadgeGRMDSTT02,
  author    = {Robert Madge and
               B. H. Goh and
               V. Rajagopalan and
               C. Macchietto and
               W. Robert Daasch and
               Chris Schuermyer and
               C. Taylor and
               David Turner},
  title     = {Screening MinVDD Outliers Using Feed-Forward Voltage Testing},
  booktitle = {ITC},
  year      = {2002},
  pages     = {673-682},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041819},
  crossref  = {DBLP:conf/itc/2002},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/2002,
  title     = {Proceedings IEEE International Test Conference 2002, Baltimore,
               MD, USA, October 7-10, 2002},
  publisher = {IEEE Computer Society},
  year      = {2002},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}