DBLP Record 'conf/itc/MadgeBTDSR04'

BibTeX

@inproceedings{DBLP:conf/itc/MadgeBTDSR04,
  author    = {Robert Madge and
               Brady Benware and
               Ritesh P. Turakhia and
               W. Robert Daasch and
               Chris Schuermyer and
               Jens Ruffler},
  title     = {In Search of the Optimum Test Set - Adaptive Test Methods
               for Maximum Defect Coverage and Lowest Test Cost},
  booktitle = {ITC},
  year      = {2004},
  pages     = {203-212},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.96},
  crossref  = {DBLP:conf/itc/2004},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/2004,
  title     = {Proceedings 2004 International Test Conference (ITC 2004),
               October 26-28, 2004, Charlotte, NC, USA},
  publisher = {IEEE},
  year      = {2003},
  isbn      = {0-7803-8581-0},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}