BibTeX record conf/itc/MacDonaldN82

download as .bib file

@inproceedings{DBLP:conf/itc/MacDonaldN82,
  author       = {Neal H. MacDonald and
                  Gordon B. Neish},
  title        = {An Algorithmic Approach to the Testing of a Wafer Scale Integrated
                  {(WSI)} Circuit},
  booktitle    = {Proceedings International Test Conference 1982, Philadelphia, PA,
                  USA, November 1982},
  pages        = {590--600},
  publisher    = {{IEEE} Computer Society},
  year         = {1982},
  timestamp    = {Tue, 30 Mar 2004 13:18:22 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/MacDonaldN82.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.