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BibTeX record conf/itc/LyuYLH23
@inproceedings{DBLP:conf/itc/LyuYLH23, author = {Yinxuan Lyu and Liangliang Yu and Pengju Li and Junlin Huang}, title = {Logic Test Vehicles for High Resolution Diagnosis of Systematic {FEOL/MEOL} Yield Detractors}, booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA, October 7-15, 2023}, pages = {117--121}, publisher = {{IEEE}}, year = {2023}, url = {https://doi.org/10.1109/ITC51656.2023.00027}, doi = {10.1109/ITC51656.2023.00027}, timestamp = {Tue, 09 Jan 2024 17:09:36 +0100}, biburl = {https://dblp.org/rec/conf/itc/LyuYLH23.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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