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BibTeX record conf/itc/LiuFB17
@inproceedings{DBLP:conf/itc/LiuFB17, author = {Zeye Liu and Phillip Fynan and Ronald D. Blanton}, title = {Front-end layout reflection for test chip design}, booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017}, pages = {1--10}, publisher = {{IEEE}}, year = {2017}, url = {https://doi.org/10.1109/TEST.2017.8242041}, doi = {10.1109/TEST.2017.8242041}, timestamp = {Mon, 24 Feb 2020 17:28:37 +0100}, biburl = {https://dblp.org/rec/conf/itc/LiuFB17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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