BibTeX record conf/itc/LinHW11

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@inproceedings{DBLP:conf/itc/LinHW11,
  author       = {Yi{-}Tsung Lin and
                  Jiun{-}Lang Huang and
                  Xiaoqing Wen},
  editor       = {Bill Eklow and
                  R. D. (Shawn) Blanton},
  title        = {Clock-gating-aware low launch {WSA} test pattern generation for at-speed
                  scan testing},
  booktitle    = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
                  USA, September 20-22, 2011},
  pages        = {1--7},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/TEST.2011.6139132},
  doi          = {10.1109/TEST.2011.6139132},
  timestamp    = {Thu, 23 Mar 2023 23:58:38 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/LinHW11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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