BibTeX record conf/itc/LinCYCH10

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@inproceedings{DBLP:conf/itc/LinCYCH10,
  author       = {Chen{-}Wei Lin and
                  Hung{-}Hsin Chen and
                  Hao{-}Yu Yang and
                  Mango Chia{-}Tso Chao and
                  Rei{-}Fu Huang},
  editor       = {Ron Press and
                  Erik H. Volkerink},
  title        = {Fault models and test methods for subthreshold SRAMs},
  booktitle    = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
                  USA, November 2-4, 2010},
  pages        = {427--436},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/TEST.2010.5699245},
  doi          = {10.1109/TEST.2010.5699245},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/LinCYCH10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}