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BibTeX record conf/itc/LinAYP18
@inproceedings{DBLP:conf/itc/LinAYP18, author = {Yibo Lin and Mohamed Baker Alawieh and Wei Ye and David Z. Pan}, title = {Machine Learning for Yield Learning and Optimization}, booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA, October 29 - Nov. 1, 2018}, pages = {1--10}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/TEST.2018.8624733}, doi = {10.1109/TEST.2018.8624733}, timestamp = {Mon, 28 Dec 2020 18:21:19 +0100}, biburl = {https://dblp.org/rec/conf/itc/LinAYP18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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