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BibTeX record conf/itc/LienL16
@inproceedings{DBLP:conf/itc/LienL16, author = {Wei{-}Cheng Lien and Kuen{-}Jong Lee}, title = {Output bit selection methodology for test response compaction}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805873}, doi = {10.1109/TEST.2016.7805873}, timestamp = {Thu, 14 Oct 2021 09:45:51 +0200}, biburl = {https://dblp.org/rec/conf/itc/LienL16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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