BibTeX record conf/itc/LiaoNWY22

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@inproceedings{DBLP:conf/itc/LiaoNWY22,
  author       = {Yiwen Liao and
                  Zahra Paria Najafi{-}Haghi and
                  Hans{-}Joachim Wunderlich and
                  Bin Yang},
  title        = {Efficient and Robust Resistive Open Defect Detection Based on Unsupervised
                  Deep Learning},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
                  September 23-30, 2022},
  pages        = {185--193},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITC50671.2022.00026},
  doi          = {10.1109/ITC50671.2022.00026},
  timestamp    = {Thu, 11 Jan 2024 22:39:39 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/LiaoNWY22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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