BibTeX record conf/itc/LiaoLGAY22

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@inproceedings{DBLP:conf/itc/LiaoLGAY22,
  author       = {Yiwen Liao and
                  Rapha{\"{e}}l Latty and
                  Paul R. Genssler and
                  Hussam Amrouch and
                  Bin Yang},
  title        = {Wafer Map Defect Classification Based on the Fusion of Pattern and
                  Pixel Information},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
                  September 23-30, 2022},
  pages        = {1--9},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITC50671.2022.00006},
  doi          = {10.1109/ITC50671.2022.00006},
  timestamp    = {Sat, 18 Feb 2023 16:43:12 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/LiaoLGAY22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}