BibTeX record conf/itc/LiLH19

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@inproceedings{DBLP:conf/itc/LiLH19,
  author       = {Huawei Li and
                  Xiaowei Li and
                  Yinhe Han},
  title        = {China Test Conference {(CTC)} - Extending the Global Test Forum to
                  China},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
                  USA, November 9-15, 2019},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/ITC44170.2019.9000121},
  doi          = {10.1109/ITC44170.2019.9000121},
  timestamp    = {Tue, 23 May 2023 16:44:01 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/LiLH19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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