Herold Levine Charles Berking Alan Blair Kenneth R. Bowden Peter deBruyn Kops David Giles David Ruhoff Kenneth Wacks Design of a New Test Generation System for Performance Testing of LSI Digital Printed Circuit Boards. 541-547 1982 conf/itc/1982 ITC db/conf/itc/itc1982.html#LevineBBBKGRW82