DBLP Record 'conf/itc/LevineBBBKGRW82'

BibTeX

@inproceedings{DBLP:conf/itc/LevineBBBKGRW82,
  author    = {Herold Levine and
               Charles Berking and
               Alan Blair and
               Kenneth R. Bowden and
               Peter deBruyn Kops and
               David Giles and
               David Ruhoff and
               Kenneth Wacks},
  title     = {Design of a New Test Generation System for Performance Testing
               of LSI Digital Printed Circuit Boards},
  booktitle = {ITC},
  year      = {1982},
  pages     = {541-547},
  crossref  = {DBLP:conf/itc/1982},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/1982,
  title     = {Proceedings International Test Conference 1982, Philadelphia,
               PA, USA, November 1982},
  booktitle = {ITC},
  publisher = {IEEE Computer Society},
  year      = {1982},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}