BibTeX record conf/itc/LernerISHMV22

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@inproceedings{DBLP:conf/itc/LernerISHMV22,
  author       = {David P. Lerner and
                  Benson Inkley and
                  Shubhada H. Sahasrabudhe and
                  Ethan Hansen and
                  Luis D. Rojas Munoz and
                  Arjan van de Ven},
  title        = {Optimization of Tests for Managing Silicon Defects in Data Centers},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
                  September 23-30, 2022},
  pages        = {578--582},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITC50671.2022.00076},
  doi          = {10.1109/ITC50671.2022.00076},
  timestamp    = {Thu, 05 Jan 2023 13:25:50 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/LernerISHMV22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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