BibTeX record conf/itc/LeiC22

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@inproceedings{DBLP:conf/itc/LeiC22,
  author       = {Jun{-}Yang Lei and
                  Abhijit Chatterjee},
  title        = {ML-Assisted Bug Emulation Experiments for Post-Silicon Multi-Debug
                  of {AMS} Circuits},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
                  September 23-30, 2022},
  pages        = {268--277},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITC50671.2022.00035},
  doi          = {10.1109/ITC50671.2022.00035},
  timestamp    = {Thu, 05 Jan 2023 13:25:50 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/LeiC22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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