BibTeX record conf/itc/LeeWPKC23

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@inproceedings{DBLP:conf/itc/LeeWPKC23,
  author       = {Seongkwan Lee and
                  Jun Yeon Won and
                  Cheolmin Park and
                  Minho Kang and
                  Jaemoo Choi},
  title        = {Method for Diagnosing Channel Damage Using {FPGA} Transceiver},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
                  October 7-15, 2023},
  pages        = {71--76},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/ITC51656.2023.00019},
  doi          = {10.1109/ITC51656.2023.00019},
  timestamp    = {Tue, 09 Jan 2024 17:09:36 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/LeeWPKC23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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