BibTeX record conf/itc/Ledford93

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@inproceedings{DBLP:conf/itc/Ledford93,
  author       = {Michael S. Ledford},
  title        = {Automotive Industry: The Next {DFT} Challenge},
  booktitle    = {Proceedings {IEEE} International Test Conference 1993, Designing,
                  Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
                  17-21, 1993},
  pages        = {19},
  publisher    = {{IEEE} Computer Society},
  year         = {1993},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/Ledford93.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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