@inproceedings{DBLP:conf/itc/LaurentBCC86,
author = {J. Laurent and
L. Bergher and
Bernard Courtois and
Jacques P. Collin},
title = {Towards Automatic Failure Analysis of Complex ICs Through
E-Beam Testing},
booktitle = {ITC},
year = {1986},
pages = {465-473},
crossref = {DBLP:conf/itc/1986},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/itc/1986,
title = {Proceedings International Test Conference 1986, Washington,
D.C., USA, September 1986},
booktitle = {ITC},
publisher = {IEEE Computer Society},
year = {1986},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
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