BibTeX
@inproceedings{DBLP:conf/itc/LaiPRC04,
author = {Liyang Lai and
Janak H. Patel and
Thomas Rinderknecht and
Wu-Tung Cheng},
title = {Logic BIST with Scan Chain Segmentation},
booktitle = {ITC},
year = {2004},
pages = {57-66},
ee = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.115},
crossref = {DBLP:conf/itc/2004},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/itc/2004,
title = {Proceedings 2004 International Test Conference (ITC 2004),
October 26-28, 2004, Charlotte, NC, USA},
publisher = {IEEE},
year = {2003},
isbn = {0-7803-8581-0},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2006-09-21 by Michael Ley (ley@uni-trier.de)