BibTeX record conf/itc/KuxUKSMBH14

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@inproceedings{DBLP:conf/itc/KuxUKSMBH14,
  author       = {Andreas Kux and
                  Rudolf Ullmann and
                  Thomas Kern and
                  Roland Strunz and
                  Hanno Melzner and
                  Stephan Beuven and
                  Andreas Haase},
  title        = {Latent defect detection in microcontroller embedded flash test using
                  device stress and wordline outlier screening},
  booktitle    = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
                  October 20-23, 2014},
  pages        = {1--7},
  publisher    = {{IEEE} Computer Society},
  year         = {2014},
  url          = {https://doi.org/10.1109/TEST.2014.7035298},
  doi          = {10.1109/TEST.2014.7035298},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/KuxUKSMBH14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}