default search action
BibTeX record conf/itc/KuxUKSMBH14
@inproceedings{DBLP:conf/itc/KuxUKSMBH14, author = {Andreas Kux and Rudolf Ullmann and Thomas Kern and Roland Strunz and Hanno Melzner and Stephan Beuven and Andreas Haase}, title = {Latent defect detection in microcontroller embedded flash test using device stress and wordline outlier screening}, booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA, October 20-23, 2014}, pages = {1--7}, publisher = {{IEEE} Computer Society}, year = {2014}, url = {https://doi.org/10.1109/TEST.2014.7035298}, doi = {10.1109/TEST.2014.7035298}, timestamp = {Thu, 23 Mar 2023 23:58:42 +0100}, biburl = {https://dblp.org/rec/conf/itc/KuxUKSMBH14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.