Automated Fault Diagnostic EB Tester and Its Application to a 40K-Gate VLSI Circuit.

Norio Kuji Teruo Tamama Automated Fault Diagnostic EB Tester and Its Application to a 40K-Gate VLSI Circuit. 643-651 1985 conf/itc/1985 ITC db/conf/itc/itc1985.html#KujiT85