BibTeX record: conf/itc/KuC91

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@inproceedings{DBLP:conf/itc/KuC91,
  author    = {{Tsu-Wei} Ku and
               {Wei-Kong} Chia},
  title     = {A Sequential Test Generator with Explicit Elimination of Easy-to-Test
               Faults.},
  booktitle = {Proceedings {IEEE} International Test Conference 1991, Test: Faster,
               Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
  year      = {1991},
  pages     = {83--87},
  crossref  = {DBLP:conf/itc/1991},
  url       = {http://dx.doi.org/10.1109/TEST.1991.519497},
  doi       = {10.1109/TEST.1991.519497},
  timestamp = {Tue, 02 Sep 2014 23:17:55 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/itc/KuC91},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/itc/1991,
  title     = {Proceedings {IEEE} International Test Conference 1991, Test: Faster,
               Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
  year      = {1991},
  publisher = {{IEEE} Computer Society},
  isbn      = {0-8186-9156-5},
  timestamp = {Tue, 02 Sep 2014 23:17:55 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/itc/1991},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}