Bram Kruseman Bratislav Tasic Camelia Hora Jos Dohmen Hamidreza Hashempour Maikel van Beurden Yizi Xing Defect Oriented Testing for analog/mixed-signal devices. 1-10 2011 ITC http://dx.doi.org/10.1109/TEST.2011.6139127 conf/itc/2011 db/conf/itc/itc2011.html#KrusemanTHDHBX11