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BibTeX record conf/itc/KrusemanOR02
@inproceedings{DBLP:conf/itc/KrusemanOR02, author = {Bram Kruseman and Stefan van den Oetelaar and Josep Rius}, title = {Comparison of {IDDQ} Testing and Very-Low Voltage Testing}, booktitle = {Proceedings {IEEE} International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002}, pages = {964--973}, publisher = {{IEEE} Computer Society}, year = {2002}, url = {https://doi.org/10.1109/TEST.2002.1041852}, doi = {10.1109/TEST.2002.1041852}, timestamp = {Thu, 23 Mar 2023 23:58:41 +0100}, biburl = {https://dblp.org/rec/conf/itc/KrusemanOR02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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