BibTeX record: conf/itc/KrsticWCM03

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@inproceedings{DBLP:conf/itc/KrsticWCM03,
  author    = {Angela Krstic and
               Li{-}C. Wang and
               Kwang{-}Ting Cheng and
               T. M. Mak},
  title     = {Diagnosis-Based Post-Silicon Timing Validation Using Statistical Tools
               and Methodologies},
  booktitle = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
               Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
               NC, {USA}},
  year      = {2003},
  pages     = {339--348},
  crossref  = {DBLP:conf/itc/2003},
  url       = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270856},
  doi       = {10.1109/TEST.2003.1270856},
  timestamp = {Fri, 19 Sep 2014 10:12:49 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/itc/KrsticWCM03},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/itc/2003,
  title     = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
               Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
               NC, {USA}},
  year      = {2003},
  publisher = {{IEEE} Computer Society},
  isbn      = {0-7803-8106-8},
  timestamp = {Fri, 19 Sep 2014 10:12:49 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/itc/2003},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}