Bernd Könemann J. Barlow Paul Chang R. Gabrielson C. Goertz Brion L. Keller Kevin McCauley J. Tischer Vijay S. Iyengar Barry K. Rosen T. Williams Delay Test: The Next Frontier for LSSD Test Systems. 578-587 1992 conf/itc/1992 ITC db/conf/itc/itc1992.html#KonemannBCGGKMTIRW92 http://dx.doi.org/10.1109/TEST.1992.527878