@inproceedings{DBLP:conf/itc/KnebelSMKTVHNRSM98,
  author    = {Daniel R. Knebel and
               Pia Sanda and
               Moyra K. McManus and
               Jeffrey A. Kash and
               James C. Tsang and
               David P. Vallett and
               Leendert M. Huisman and
               Phil Nigh and
               Rick Rizzolo and
               Peilin Song and
               Franco Motika},
  title     = {Diagnosis and characterization of timing-related defects
               by time-dependent light emission},
  booktitle = {ITC},
  year      = {1998},
  pages     = {733-739},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/TEST.1998.743254},
  crossref  = {DBLP:conf/itc/1998},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/1998,
  title     = {Proceedings IEEE International Test Conference 1998, Washington,
               DC, USA, October 18-22, 1998},
  publisher = {IEEE Computer Society},
  year      = {1998},
  isbn      = {0-7803-5093-6},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}