BibTeX record conf/itc/KimCT97

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@inproceedings{DBLP:conf/itc/KimCT97,
  author       = {Von{-}Kyoung Kim and
                  Tom Chen and
                  Mick Tegethoff},
  title        = {{ASIC} Manufacturing Test Cost Prediction at Early Design Stage},
  booktitle    = {Proceedings {IEEE} International Test Conference 1997, Washington,
                  DC, USA, November 3-5, 1997},
  pages        = {356--361},
  publisher    = {{IEEE} Computer Society},
  year         = {1997},
  url          = {https://doi.org/10.1109/TEST.1997.639637},
  doi          = {10.1109/TEST.1997.639637},
  timestamp    = {Thu, 23 Mar 2023 23:58:38 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/KimCT97.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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