BibTeX record conf/itc/KikuchiHSSKMY95

• > Home > conf/itc/KikuchiHSSKMY95

@inproceedings{DBLP:conf/itc/KikuchiHSSKMY95,
  author       = {Shuji Kikuchi and
                  Yoshihiko Hayashi and
                  Takashi Suga and
                  Jun Saitou and
                  Masahiko Kaneko and
                  Takashi Matsumoto and
                  Ryozou Yoshino},
  title        = {A Gate-Array-Based 666MHz {VLSI} Test System},
  booktitle    = {Proceedings {IEEE} International Test Conference 1995, Driving Down
                  the Cost of Test, Washington, DC, USA, October 21-25, 1995},
  pages        = {451--458},
  publisher    = {{IEEE} Computer Society},
  year         = {1995},
  url          = {https://doi.org/10.1109/TEST.1995.529872},
  doi          = {10.1109/TEST.1995.529872},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/KikuchiHSSKMY95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}