KhursheedZAAK10'

@inproceedings{DBLP:conf/itc/KhursheedZAAK10,
  author    = {S. Saqib Khursheed and
               Shida Zhong and
               Robert C. Aitken and
               Bashir M. Al-Hashimi and
               Sandip Kundu},
  title     = {Modeling the impact of process variation on resistive bridge
               defects},
  booktitle = {ITC},
  year      = {2010},
  pages     = {295-304},
  ee        = {http://dx.doi.org/10.1109/TEST.2010.5699230},
  crossref  = {DBLP:conf/itc/2010},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/2010,
  editor    = {Ron Press and
               Erik H. Volkerink},
  title     = {2011 IEEE International Test Conference, ITC 2010, Austin,
               TX, USA, November 2-4, 2010},
  booktitle = {ITC},
  publisher = {IEEE},
  year      = {2010},
  isbn      = {978-1-4244-7206-2},
  ee        = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5684496},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}