Martin Keim Nagesh Tamarapalli Huaxing Tang Manish Sharma Janusz Rajski Chris Schuermyer Brady Benware A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis. 1-10 2006 ITC http://dx.doi.org/10.1109/TEST.2006.297715 conf/itc/2006 db/conf/itc/itc2006.html#KeimTTSRSB06