DBLP Record 'conf/itc/KameyamaOET92'

BibTeX

@inproceedings{DBLP:conf/itc/KameyamaOET92,
  author    = {Shuichi Kameyama and
               Hideyuki Ohara and
               Chihiro Endo and
               Naoki Takayama},
  title     = {Interconnect and Delay Testing with a 4800-Pin Board Tester},
  booktitle = {ITC},
  year      = {1992},
  pages     = {338-344},
  crossref  = {DBLP:conf/itc/1992},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/1992,
  title     = {Proceedings IEEE International Test Conference 1992, Discover
               the New World of Test and Design, Baltimore, Maryland, USA,
               September 20-24, 1992},
  booktitle = {ITC},
  publisher = {IEEE Computer Society},
  year      = {1992},
  isbn      = {0-7803-0760-7},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}