@inproceedings{DBLP:conf/itc/JinPKCG03,
author = {Le Jin and
Kumar L. Parthasarathy and
Turker Kuyel and
Degang Chen and
Randall L. Geiger},
title = {Linearity Testing of Precision Analog-to-Digital Converters
Using Stationary Nonlinear Inputs},
booktitle = {ITC},
year = {2003},
pages = {218-227},
ee = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270843},
crossref = {DBLP:conf/itc/2003},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/itc/2003,
title = {Proceedings 2003 International Test Conference (ITC 2003),
Breaking Test Interface Bottlenecks, 28 September - 3 October
2003, Charlotte, NC, USA},
publisher = {IEEE Computer Society},
year = {2003},
isbn = {0-7803-8106-8},
bibsource = {DBLP, http://dblp.uni-trier.de}
}