BibTeX record conf/itc/JinCJBKGGC17

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@inproceedings{DBLP:conf/itc/JinCJBKGGC17,
  author       = {Xiankun Jin and
                  Tao Chen and
                  Mayank Jain and
                  Arun Kumar Barman and
                  David Kramer and
                  Doug Garrity and
                  Randall L. Geiger and
                  Degang Chen},
  title        = {An on-chip {ADC} {BIST} solution and the {BIST} enabled calibration
                  scheme},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
                  USA, October 31 - Nov. 2, 2017},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/TEST.2017.8242032},
  doi          = {10.1109/TEST.2017.8242032},
  timestamp    = {Tue, 26 Jul 2022 14:45:21 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/JinCJBKGGC17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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