BibTeX record conf/itc/Jian-CaoD86

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@inproceedings{DBLP:conf/itc/Jian-CaoD86,
  author       = {Jian{-}Cao Wang and
                  Daozheng Wei},
  title        = {A New Testability Measure for Digital Circuits},
  booktitle    = {Proceedings International Test Conference 1986, Washington, D.C.,
                  USA, September 1986},
  pages        = {506--513},
  publisher    = {{IEEE} Computer Society},
  year         = {1986},
  timestamp    = {Wed, 18 May 2011 07:37:46 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/Jian-CaoD86.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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