EDT channel bandwidth management in SoC designs with pattern-independent test access mechanism.

Jakub Janicki Jerzy Tyszer Avijit Dutta Mark Kassab Grzegorz Mrugalski Nilanjan Mukherjee Janusz Rajski EDT channel bandwidth management in SoC designs with pattern-independent test access mechanism. 1-9 2011 ITC http://dx.doi.org/10.1109/TEST.2011.6139170 conf/itc/2011 db/conf/itc/itc2011.html#JanickiTDKMMR11