Embedded DRAM built in self test and methodology for test insertion.

Peter Jakobsen Jeffrey Dreibelbis Gary Pomichter Darren Anand John E. Barth Jr. Michael R. Nelms Jeffrey Leach George M. Belansek Embedded DRAM built in self test and methodology for test insertion. 975-984 2001 conf/itc/2001 ITC db/conf/itc/itc2001.html#JakobsenDPABNLB01 http://doi.ieeecomputersociety.org/10.1109/TEST.2001.966722