JakobsenDPABNLB01'

@inproceedings{DBLP:conf/itc/JakobsenDPABNLB01,
  author    = {Peter Jakobsen and
               Jeffrey Dreibelbis and
               Gary Pomichter and
               Darren Anand and
               John E. Barth Jr. and
               Michael R. Nelms and
               Jeffrey Leach and
               George M. Belansek},
  title     = {Embedded DRAM built in self test and methodology for test
               insertion},
  booktitle = {ITC},
  year      = {2001},
  pages     = {975-984},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/TEST.2001.966722},
  crossref  = {DBLP:conf/itc/2001},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/2001,
  title     = {Proceedings IEEE International Test Conference 2001, Baltimore,
               MD, USA, 30 October - 1 November 2001},
  publisher = {IEEE Computer Society},
  year      = {2001},
  isbn      = {0-7803-7169-0},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}