BibTeX record conf/itc/JagannadhaYSCSB16

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@inproceedings{DBLP:conf/itc/JagannadhaYSCSB16,
  author       = {Pavan Kumar Datla Jagannadha and
                  Mahmut Yilmaz and
                  Milind Sonawane and
                  Sailendra Chadalavada and
                  Shantanu Sarangi and
                  Bonita Bhaskaran and
                  Ayub Abdollahian},
  title        = {Advanced test methodology for complex SoCs},
  booktitle    = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
                  TX, USA, November 15-17, 2016},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/TEST.2016.7805857},
  doi          = {10.1109/TEST.2016.7805857},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/JagannadhaYSCSB16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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